Skip to main content Skip to main navigation menu Skip to site footer
Journal of Applied Electrical Engineering
  • Home
  • Issue
    • Current
    • Archives
  • People
    • Editorial Team
    • Reviewer JAEE
  • Login
  • Submissions
  • About
    • Privacy Statement
    • Contact
    • Publication Frequently
    • Announcements
  • Register
  • Login
  1. Home /
  2. Search

Search

Advanced filters
Published After
Published Before

Search Results

Found one item.
  • Penggunaan SEM dan Image-J dalam Mempelajari Ketebalan Lapisan Mikrostruktur

    Muhammad Iqbal, Muhammad Firdaus, Muhammad Al Fauzan, Meilan Novayanti, Fathiyyah Syahidah Sujana, M. Rifan Maulana, Hana Mutialif Maulidiah, Widya Rika Puspita Rika Puspita, Mustanir Mustanir, Adlian Jefiza, Budiana Budiana, Nur Sakinah Asaad
    69-74
    2021-12-30
1 - 1 of 1 items

Menu Navigation

 

 Home

Focus and Scope

 Editorial Team

Peer-Reviewers

Author Guidelines 

Publication Ethics  

Privacy Statement

Copyright

Contact Us

Template JAEE

Index

Indexed by:

 

Tools:

Current Issue

  • Atom logo
  • RSS2 logo
  • RSS1 logo

Flag Counter

Information

  • For Readers
  • For Authors
  • For Librarians

Make a Submission

Make a Submission

Developed By

Open Journal Systems

Language

  • Bahasa Indonesia
  • English

Browse

Organized by : Department of Electrical Engineering Politeknik Negeri Batam
Published by : Politeknik Negeri Batam
Jl. Ahmad Yani, Batam Center, Batam 29461
Phone: +62 778 469856 Ext 1041

JAEE is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.

More information about the publishing system, Platform and Workflow by OJS/PKP.