Iqbal, Muhammad, Muhammad Firdaus, Muhammad Fauzan, Meilan Novayanti, Fathiyyah Sujana, M. Maulana, Hana Maulidiah, Widya Rika Puspita Puspita, Mustanir Mustanir, Adlian Jefiza, Budiana Budiana, and Nur Asaad. “Penggunaan SEM Dan Image-J Dalam Mempelajari Ketebalan Lapisan Mikrostruktur”. Journal of Applied Electrical Engineering 5, no. 2 (December 30, 2021): 69-74. Accessed April 19, 2024. https://jurnal.polibatam.ac.id/index.php/JAEE/article/view/3746.