IQBAL, Muhammad et al. Penggunaan SEM dan Image-J dalam Mempelajari Ketebalan Lapisan Mikrostruktur. Journal of Applied Electrical Engineering, [S. l.], v. 5, n. 2, p. 69–74, 2021. DOI: 10.30871/jaee.v5i2.3746. Disponível em: https://jurnal.polibatam.ac.id/index.php/JAEE/article/view/3746. Acesso em: 15 feb. 2025.