Iqbal, M., Firdaus, M., Fauzan, M., Novayanti, M., Sujana, F., Maulana, M., Maulidiah, H., Puspita, W.R.P., Mustanir, M., Jefiza, A., Budiana, B. and Asaad, N. 2021. Penggunaan SEM dan Image-J dalam Mempelajari Ketebalan Lapisan Mikrostruktur. Journal of Applied Electrical Engineering. 5, 2 (Dec. 2021), 69-74. DOI:https://doi.org/10.30871/jaee.v5i2.3746.